Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study
Crossref DOI link: https://doi.org/10.1007/s10845-020-01680-0
Published Online: 2020-10-13
Published Print: 2022-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Fu, Wenhan
Chien, Chen-Fu http://orcid.org/0000-0003-3328-4946
Tang, Lizhen
Funding for this research was provided by:
Ministry of Science and Technology, Taiwan (MOST 108-2634-F-007-001, MOST 108-2634-F-007-008)
Text and Data Mining valid from 2020-10-13
Version of Record valid from 2020-10-13
Article History
Accepted: 24 September 2020
First Online: 13 October 2020