Synthetic data augmentation for surface defect detection and classification using deep learning
Crossref DOI link: https://doi.org/10.1007/s10845-020-01710-x
Published Online: 2020-11-18
Published Print: 2022-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jain, Saksham
Seth, Gautam
Paruthi, Arpit
Soni, Umang http://orcid.org/0000-0003-3583-311X
Kumar, Girish
Text and Data Mining valid from 2020-11-18
Version of Record valid from 2020-11-18
Article History
Received: 29 October 2019
Accepted: 29 October 2020
First Online: 18 November 2020