The effect of fast annealing treatment on the interface structure and electrical properties of Au/Hg3In2Te6 contact
Crossref DOI link: https://doi.org/10.1007/s10853-014-8324-y
Published Online: 2014-06-19
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sun, Jie
Fu, Li
Ringer, S. P.
Li, Yapeng
Liu, Zongwen
Text and Data Mining valid from 2014-06-19