Insights into the structural, electronic, and magnetic properties of Fe2−x Ti x O3/Fe2O3 thin films with x = 0.44 grown on Al2O3 (0001)
Crossref DOI link: https://doi.org/10.1007/s10853-014-8572-x
Published Online: 2014-09-11
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dennenwaldt, Teresa
Lübbe, Maike
Winklhofer, Michael
Müller, Alexander
Döblinger, Markus
Nabi, Hasan Sadat
Gandman, Maria
Cohen-Hyams, Tzipi
Kaplan, Wayne D.
Moritz, Wolfgang
Pentcheva, Rossitza
Scheu, Christina
Text and Data Mining valid from 2014-09-11