Comparison between the ferroelectric/electric properties of the PbZr0.52Ti0.48O3 films grown on Si (100) and on STO (100) substrates
Crossref DOI link: https://doi.org/10.1007/s10853-015-8907-2
Published Online: 2015-03-14
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Chirila, Cristina
Boni, Andra Georgia
Pasuk, Iuliana
Negrea, Raluca
Trupina, Lucian
Le Rhun, Gwenael
Yin, Shi
Vilquin, Bertrand
Pintilie, Ioana
Pintilie, Lucian
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