Vanadium oxide films deposited on sapphire substrate with in situ AlN stress layer: structural, electric, and optical properties
Crossref DOI link: https://doi.org/10.1007/s10853-015-9112-z
Published Online: 2015-05-29
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bian, Jiming
Miao, Lihua
Zhao, Shukuo
Li, Xiaoxuan
Zou, Chongwen
Zhang, Dong
Zhang, Yuzhi
Text and Data Mining valid from 2015-05-29