On the pressing need to address beam–sample interactions in atomic resolution electron microscopy
Crossref DOI link: https://doi.org/10.1007/s10853-015-9545-4
Published Online: 2015-11-04
Published Print: 2016-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kisielowski, Christian
Funding for this research was provided by:
U.S. Department of Energy (DE-AC02-05CH11231)
Text and Data Mining valid from 2015-11-04
Version of Record valid from 2015-11-04
Article History
Received: 24 October 2015
Accepted: 27 October 2015
First Online: 4 November 2015