In situ monitoring and ex situ TEM analyses of spinel (MgAl $$_2$$ 2 O $$_4$$ 4 ) growth between (111)-oriented periclase (MgO) substrates and Al $$_2$$ 2 O $$_3$$ 3 thin films
Crossref DOI link: https://doi.org/10.1007/s10853-016-0130-2
Published Online: 2016-06-21
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Götze, L. C.
Milke, R.
Zizak, I.
Wirth, R.
Funding for this research was provided by:
Deutsche Forschungsgemeinschaft
License valid from 2016-06-21