Isothermal differential dilatometry based on X-ray analysis applied to stress relaxation in thin ion-beam-sputtered Pt films
Crossref DOI link: https://doi.org/10.1007/s10853-016-0458-7
Published Online: 2016-10-11
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gruber, Wolfgang
Baehtz, Carsten
Geue, Thomas
Stahn, Jochen
Schmidt, Harald
License valid from 2016-10-11