Structural investigations of pulsed laser-deposited NiO epitaxial layers under different fluence values
Crossref DOI link: https://doi.org/10.1007/s10853-018-3004-y
Published Online: 2018-10-16
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Singh, S. D.
Patra, Nirmalendu
Singh, M. N.
Mukherjee, C.
Jha, S. N.
Sinha, A. K.
Ganguli, Tapas
Text and Data Mining valid from 2018-10-16
Article History
Received: 11 June 2018
Accepted: 8 October 2018
First Online: 16 October 2018