Structure and refractive index of thin alumina films grown by atomic layer deposition
Crossref DOI link: https://doi.org/10.1007/s10854-014-2111-z
Published Online: 2014-06-27
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Aguilar-Gama, M. Tulio
Ramírez-Morales, Erik
Montiel-González, Z.
Mendoza-Galván, A.
Sotelo-Lerma, Mérida
Nair, P. K.
Hu, Hailin
Text and Data Mining valid from 2014-06-27