Microwave dielectric properties of bismuth layer-structured Ca2−xSrxBi4Ti5O18 (0 ≤ x ≤ 0.6) ceramics
Crossref DOI link: https://doi.org/10.1007/s10854-014-2482-1
Published Online: 2015-01-21
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Niu, Benben
Ma, Weibing
Li, Qiang
Chen, Tiankai
Huan, Zhengli
Meng, Xueyuan
Ma, Jianqiang
Text and Data Mining valid from 2015-01-21