Surface properties of AlN and Al x Ga1−x N epitaxial layers characterized by angle resolved X-ray photoelectron spectroscopy
Crossref DOI link: https://doi.org/10.1007/s10854-014-2487-9
Published Online: 2014-11-09
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yang, Hongquan
Zhang, Xiong
Wang, Shuchang
Zhu, Min
Cui, Yiping
Dai, Ning
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