Optimization and modelling of preparation conditions of CuS thin films deposited by successive ionic layer adsorption and reaction (SILAR) method using response surface methodology
Crossref DOI link: https://doi.org/10.1007/s10854-015-2952-0
Published Online: 2015-03-20
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yücel, Yasin
Yücel, Ersin
Gökhan, Didem
Text and Data Mining valid from 2015-03-20