Effect of pulsed voltage on electrochemical migration of tin in electronics
Crossref DOI link: https://doi.org/10.1007/s10854-015-3454-9
Published Online: 2015-07-11
Published Print: 2015-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Verdingovas, Vadimas
Jellesen, Morten Stendahl
Ambat, Rajan
Text and Data Mining valid from 2015-07-11