Rietveld analysis of CaCu3Ti4O12 thin films obtained by RF-sputtering
Crossref DOI link: https://doi.org/10.1007/s10854-015-4084-y
Published Online: 2015-11-25
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Foschini, C. R.
Tararam, R.
Simões, A. Z.
Rocha, L. S.
Santos, C. O. P.
Longo, E.
Varela, J. A.
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