Structural, morphological and spectroscopic ellipsometry studies on sputter deposited Sb2S3 thin films
Crossref DOI link: https://doi.org/10.1007/s10854-016-5033-0
Published Online: 2016-05-27
Published Print: 2016-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Medina-Montes, M. I.
Montiel-González, Z.
Paraguay-Delgado, F.
Mathews, N. R.
Mathew, X.
Text and Data Mining valid from 2016-05-27