Dielectric relaxations in Ba0.85Sr0.15TiO3 thin films deposited on Pt/Ti/SiO2/Si substrates by sol–gel method
Crossref DOI link: https://doi.org/10.1007/s10854-016-5253-3
Published Online: 2016-06-28
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Selmi, A.
Khaldi, O.
Mascot, M.
Jomni, F.
Carru, J. C.
License valid from 2016-06-28