Effect of post-annealing time on the properties of sputtered Al-doped ZnO thin films
Crossref DOI link: https://doi.org/10.1007/s10854-016-5261-3
Published Online: 2016-06-30
Published Print: 2016-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Deok-Kyu
Kim, Hong-Bae
License valid from 2016-06-30