A detailed study on the frequency-dependent electrical characteristics of Al/HfSiO4/p-Si MOS capacitors
Crossref DOI link: https://doi.org/10.1007/s10854-016-5461-x
Published Online: 2016-08-05
Published Print: 2016-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lok, R.
Kaya, S.
Karacali, H.
Yilmaz, E.
License valid from 2016-08-05