Yttrium oxide nanostructured thin films deposited by radio frequency sputtering: the annealing optimizations and correlations between structural, morphological, optical and electrical properties
Crossref DOI link: https://doi.org/10.1007/s10854-017-7241-7
Published Online: 2017-06-02
Published Print: 2017-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Abubakar, Saleh
Kaya, Senol
Aktag, Aliekber
Yilmaz, Ercan
Funding for this research was provided by:
Abant Izzet Baysal Üniversitesi (AIBU, BAP. 2015.03.02.870, BAP. 2014.03.02.722)
Ministry of Development of Turkey (2016K121110)
License valid from 2017-06-02