Influence of Cu incorporation on ionic conductivity and dielectric relaxation mechanism in NiO thin films synthesized by CBD
Crossref DOI link: https://doi.org/10.1007/s10854-017-8024-x
Published Online: 2017-10-16
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Das, M. R.
Mukherjee, A.
Mitra, P.
License valid from 2017-10-16