Characterization of GZO thin films fabricated by RF magnetron sputtering method and electrical properties of In/GZO/Si/Al diode
Crossref DOI link: https://doi.org/10.1007/s10854-019-02286-w
Published Online: 2019-09-28
Published Print: 2019-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bayraklı Sürücü, Ö. http://orcid.org/0000-0002-8478-1267
Text and Data Mining valid from 2019-09-28
Version of Record valid from 2019-09-28
Article History
Received: 1 September 2019
Accepted: 25 September 2019
First Online: 28 September 2019