Electrical characterization of silicon nitride interlayer-based MIS diode
Crossref DOI link: https://doi.org/10.1007/s10854-020-03533-1
Published Online: 2020-05-11
Published Print: 2020-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Buyukbas-Ulusan, A.
Tataroglu, A. http://orcid.org/0000-0003-2074-574X
Text and Data Mining valid from 2020-05-11
Version of Record valid from 2020-05-11
Article History
Received: 12 March 2020
Accepted: 1 May 2020
First Online: 11 May 2020