Novel polyethersulfone dielectric films with high temperature resistance, intrinsic low dielectric constant and low dielectric loss
Crossref DOI link: https://doi.org/10.1007/s10854-020-04873-8
Published Online: 2020-11-20
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pu, Zejun http://orcid.org/0000-0001-8551-2467
Xia, Jialing
Liu, Xueyu
Wang, Qi
Liu, Jingyue
He, Xiaohang
Zhong, Jiachun
Text and Data Mining valid from 2020-11-20
Version of Record valid from 2020-11-20
Article History
Received: 27 August 2020
Accepted: 10 November 2020
First Online: 20 November 2020