Electron emission properties of cold cathodes based on porous silicon layer processed by electrochemical oxidation and high-pressure water vapor annealing
Crossref DOI link: https://doi.org/10.1007/s10934-015-9949-1
Published Online: 2015-03-22
Published Print: 2015-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hu, Wenbo
Zhao, Xiaolei
Fan, Jinlong
Wu, Shengli
Zhang, Jingtao
Text and Data Mining valid from 2015-03-22