Recurrence Tracking Microscope: Nanoscanning Via Bose–Einstein Condensation
Crossref DOI link: https://doi.org/10.1007/s10946-017-9615-y
Published Online: 2017-02-28
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Khan, Hayat
Saif, Farhan
License valid from 2017-01-01