Manipulating Electronic States at Oxide Interfaces Using Focused Micro X-Rays from Standard Lab Sources
Crossref DOI link: https://doi.org/10.1007/s10948-014-2902-8
Published Online: 2014-12-17
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Poccia, Nicola
Ricci, Alessandro
Coneri, Francesco
Stehno, Martin
Campi, Gaetano
Demitri, Nicola
Bais, Giorgio
Wang, X. Renshaw
Hilgenkamp, H.
Text and Data Mining valid from 2014-12-17