Analysis of depth profiles of 10B and 6Li in Si wafers and lithium ion battery electrodes using the KAERI-NDP system
Crossref DOI link: https://doi.org/10.1007/s10967-015-4630-3
Published Online: 2015-12-08
Published Print: 2016-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Park, B. G.
Sun, G. M.
Funding for this research was provided by:
National Research Foundation of Korea (2012M2A2A6004263)
Text and Data Mining valid from 2015-12-08