Effects of residual stress on the electrical properties in PbZr0.52Ti0.48O3 thin films
Crossref DOI link: https://doi.org/10.1007/s10971-015-3725-1
Published Online: 2015-05-10
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wu, Zhi
Zhou, Jing
Chen, Wen
Shen, Jie
Lv, Chun
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