Characterization of sol–gel thin films by ellipsometric porosimetry
Crossref DOI link: https://doi.org/10.1007/s10971-017-4473-1
Published Online: 2017-08-05
Published Print: 2017-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Löbmann, Peer
License valid from 2017-08-05