Determination of Concentration of Organic Contaminants on a Silicon Dioxide Surface by Tribometry
Crossref DOI link: https://doi.org/10.1007/s11018-017-1285-1
Published Online: 2017-12-05
Published Print: 2017-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ivliev, N. A.
Kolpakov, V. A.
Krichevskii, S. V.
Kazanskiy, N. L.
License valid from 2017-12-01