Open-loop electrooptic sampling for real-time analysis and near-field imaging of ultrafast electronic devices
Crossref DOI link: https://doi.org/10.1007/s11082-017-1028-1
Published Online: 2017-04-26
Published Print: 2017-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jamshidifar, Mehran
BolĂvar, Peter Haring
Funding for this research was provided by:
FP 7 (FP7-224189)
License valid from 2017-04-26