A new approach to modelling Kelvin probe force microscopy of hetero-structures in the dark and under illumination
Crossref DOI link: https://doi.org/10.1007/s11082-017-1305-z
Published Online: 2018-01-04
Published Print: 2018-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Huang, Yong http://orcid.org/0000-0001-8776-3577
Gheno, Alexandre
Rolland, Alain
Pedesseau, Laurent
Vedraine, Sylvain
Durand, Olivier
Bouclé, Johann
Connolly, James P.
Etgar, Lioz
Even, Jacky
License valid from 2018-01-01