Characterization of CuO/n–Si pn junction synthesized by successive ionic layer adsorption and reaction method
Crossref DOI link: https://doi.org/10.1007/s11082-019-1951-4
Published Online: 2019-06-27
Published Print: 2019-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Alkhayatt, Adel H. Omran
Jaafer, Mustafa D.
Al Alak, Hassan Hadi Ali
Ali, Asala H.
Text and Data Mining valid from 2019-06-27
Version of Record valid from 2019-06-27
Article History
Received: 14 April 2019
Accepted: 22 June 2019
First Online: 27 June 2019