Influence of sputtered time on the structural and optical characterization of Al-doped ZnO thin films prepared by RF sputtering technique
Crossref DOI link: https://doi.org/10.1007/s11082-020-02687-w
Published Online: 2021-01-01
Published Print: 2021-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ghobadi, Nader
Shiravand, Mahdiyeh
Hatam, Ebrahim Gholami
Text and Data Mining valid from 2021-01-01
Version of Record valid from 2021-01-01
Article History
Received: 7 September 2020
Accepted: 19 December 2020
First Online: 1 January 2021