Volatilization and Transport Mechanisms During Cr Oxidation at 300 °C Studied In Situ by ToF-SIMS
Crossref DOI link: https://doi.org/10.1007/s11085-017-9756-y
Published Online: 2017-02-28
Published Print: 2017-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Poulain, Clément
Seyeux, Antoine
Voyshnis, Svetlana
Marcus, Philippe
Funding for this research was provided by:
Électricité de France
Conseil Régional, Île-de-France
CNRS
License valid from 2017-02-28