Two-phase edge outlier detection method for technology opportunity discovery
Crossref DOI link: https://doi.org/10.1007/s11192-017-2472-1
Published Online: 2017-08-04
Published Print: 2017-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Byunghoon
Gazzola, Gianluca
Yang, Jaekyung
Lee, Jae-Min
Coh, Byoung-Youl
Jeong, Myong K.
Jeong, Young-Seon
License valid from 2017-08-04