Which process metrics can significantly improve defect prediction models? An empirical study
Crossref DOI link: https://doi.org/10.1007/s11219-014-9241-7
Published Online: 2014-06-17
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Madeyski, Lech
Jureczko, Marian
License valid from 2014-06-17