Software defect prediction: do different classifiers find the same defects?
Crossref DOI link: https://doi.org/10.1007/s11219-016-9353-3
Published Online: 2017-02-07
Published Print: 2018-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bowes, David
Hall, Tracy
Petrić, Jean http://orcid.org/0000-0003-1949-2706
Funding for this research was provided by:
Engineering and Physical Sciences Research Council (EP/L011751/1)
License valid from 2017-02-07