Low Energy Signal Processing Techniques for Reliability Improvement of High-Density NAND Flash Memory
Crossref DOI link: https://doi.org/10.1007/s11265-014-0943-7
Published Online: 2014-09-19
Published Print: 2015-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Lee, Dong-hwan
Kim, Jonghong
Sung, Wonyong
Text and Data Mining valid from 2014-09-19