Multi-Metrics Approach for Security, Privacy and Dependability in Embedded Systems
Crossref DOI link: https://doi.org/10.1007/s11277-015-2478-z
Published Online: 2015-03-13
Published Print: 2015-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Garitano, IƱaki
Fayyad, Seraj
Noll, Josef
Text and Data Mining valid from 2015-03-13