Measurement of Local Thermal Deformations in Heterogeneous Microstructures via SEM Imaging with Digital Image Correlation
Crossref DOI link: https://doi.org/10.1007/s11340-016-0206-6
Published Online: 2016-08-25
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Guo, S. M.
Sutton, M. A.
Li, N.
Li, X. D.
Wang, L. W.
Rajan, S.
Funding for this research was provided by:
Intel Corporation (2011-IN-2171)
License valid from 2016-08-25