Real-Time Stress Measurement in SiO2 Thin Films during Electrochemical Lithiation/Delithiation Cycling
Crossref DOI link: https://doi.org/10.1007/s11340-017-0371-2
Published Online: 2018-01-10
Published Print: 2018-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rakshit, S.
Tripuraneni, R.
Nadimpalli, S. P. V.
License valid from 2018-01-10