A Robust Patterning Technique for Electron Microscopy-Based Digital Image Correlation at Sub-Micron Resolutions
Crossref DOI link: https://doi.org/10.1007/s11340-019-00487-2
Published Online: 2019-03-11
Published Print: 2019-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Montgomery, C.B.
Koohbor, B.
Sottos, N.R. http://orcid.org/0000-0002-5818-520X
Funding for this research was provided by:
Air Force Office of Scientific Research (FA9550-12-1-0445)
Text and Data Mining valid from 2019-03-11
Version of Record valid from 2019-03-11
Article History
Received: 15 November 2018
Accepted: 20 February 2019
First Online: 11 March 2019