Optoeletronic investigation of Cu2ZnSn(S,Se)4 thin-films & Cu2ZnSn(S,Se)4/CdS interface with scanning probe microscopy
Crossref DOI link: https://doi.org/10.1007/s11426-015-5444-4
Published Online: 2015-08-03
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Jiangjun
Zou, Yugang
Chen, Ting
Hu, Jinsong
Wang, Dong
Wan, Li-Jun
Text and Data Mining valid from 2015-08-03