Analyzing and mitigating the internal single-event transient in radiation hardened flip-flops at circuit-level
Crossref DOI link: https://doi.org/10.1007/s11431-014-5595-0
Published Online: 2014-07-07
Published Print: 2014-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Liang, Bin
Song, RuiQiang
Text and Data Mining valid from 2014-07-07