Implantation induced defects and electrical properties of Sb-implanted ZnO
Crossref DOI link: https://doi.org/10.1007/s11431-015-5868-2
Published Online: 2015-06-27
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Xie, Hui
Liu, Tong
Liu, JingMing
Cao, KeWei
Dong, ZhiYuan
Yang, Jun
Zhao, YouWen
Text and Data Mining valid from 2015-06-27