Analytical current model of tunneling field-effect transistor considering the impacts of both gate and drain voltages on tunneling
Crossref DOI link: https://doi.org/10.1007/s11432-014-5196-3
Published Online: 2014-10-10
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Chao
Wu, ChunLei
Wang, JiaXin
Huang, QianQian
Huang, Ru
Text and Data Mining valid from 2014-10-10