Area-efficient transient power-rail electrostatic discharge clamp circuit with mis-triggering immunity in a 65-nm CMOS process
Crossref DOI link: https://doi.org/10.1007/s11432-015-5398-3
Published Online: 2015-09-29
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Yuan
Lu, Guangyi
Guo, Haibing
Cao, Jian
Jia, Song
Zhang, Xing
Text and Data Mining valid from 2015-09-29